Spectral Reflectance Film Thickness Measurement System thin-film 190–800 nm 80 Hz sampling

190–800 nm 80 Hz sampling

high-intensityCode: ATT

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BLC-20/30 UV Lamp

Spectral Reflectance Film Thickness Measurement System thin-film 190–800 nm 80 Hz samplingSpectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm